Randomised benchmarking and non-destructive readout

We have demonstrated high-fidelity randomised benchmarking of single qubit microwave gates across an array of 225 atoms using conventional readout techniques using strings of up to 1000 random gates. We achieved an average gate error of 8×10^-5 which is below the threshold for fault tolerant operations, highlighting the viability of neutral atoms for scalable computing.

We further demonstrated non-destructive readout using state-selective imaging on the stretched state transition to enable post-selection for loss and avoiding the requirement to reload the arrays after every sequence.

For more details see our paper Phys. Rev. Lett. 131, 030602 (2023) [arXiv].